Midwave-Infrared
Laser Unequal Path Interferometer


The IR LUPI (Laser Unequal Path Interferometer) operates at a wavelength of 3.39 micrometers and features an internal He-Ne IR laser as well as an integral collinear visible alignment laser. The IR LUPI is the ideal instrument for testing mid-wave infrared imaging systems of any size or complexity.

  State of the Art Resolution and Accuracy  
Includes a 640x512-pixel high-resolution cooled InSb camera.  
Features Diffraction International’s Durango™ fringe analysis software. Download the LUPI Datasheet
System accuracy specified as 0.008 λ RMS @ 3.39µm, with repeatability of 0.001 λ RMS
(Static Fringe Analysis).		  

  Designed to Maximize Your Productivity  
Integrated aperture zoom, focus, and panning provide optimized viewing of the fringe pattern.
  
Optional objective lenses convert the output to a diverging beam for testing cameras, lenses, and other imaging systems.  
An optional Translation Base provides extended 3-axis positioning travel offering unprecedented positioning flexibility.  
Internal reference mirror features selectable effective reflectivity values of 90%, 40%,
and 4% to match the optics under test, available at the turn of a knob.
  


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© 1995-2010 Optikos Corporation.
All information contained herein is the property of Optikos Corporation and cannot be reproduced, in whole or in part, without its written consent. VideoMTF® Image Analysis Module and Optikos Corporation® are registered trademarks of Optikos Corporation. I-SITE™, OpTest™ and EROS™ are trademarks of Optikos Corporation. Other product and company names may be trademarks and/or registered trademarks of their respective companies. The VideoMTF® Image Analysis Module is protected under U.S. Patent number 5,661,816; the LMI Family of Instruments under U. S. Patent Numbers 5,280,336 and 5,416,574; and patents are pending on the SMI Family of Instruments.