Exhibition: October 24-28, 2010
Rochester Riverside Convention Center
Rochester, NY, USA
       
       


  9/07 - Optikos President receives OSA Service Award
  12/08 - Optikos announces newly - developed Midwave-Infrared Laser Unequal Path Interferometer
  1/08 - Optikos expands its custom electro-optical manufacturing services
  1/08 - Optikos launches its Photometric Camera
  6/08 - Optikos wins SBA Massachusetts small business exporter award
  8/08 - Optikos announces of Japenese representative, Kyokko Trading
  2/09 - Optikos announces the RAD-900 Infrared Radiometer
  4/09 - Optikos announces upgrades to infra-red testing suite and I-SITE line of products
  5/09 - Stephen Fantone receives 2009 Distinguished Alumnus Award from the University of Rochester
  7/09 - Biophotonics Feature: MTF Metrology for High-NA Microscope Objectives

 


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© 1995-2010 Optikos Corporation.
All information contained herein is the property of Optikos Corporation and cannot be reproduced, in whole or in part, without its written consent. VideoMTF® Image Analysis Module and Optikos Corporation® are registered trademarks of Optikos Corporation. I-SITE™, OpTest™ and EROS™ are trademarks of Optikos Corporation. Other product and company names may be trademarks and/or registered trademarks of their respective companies. The VideoMTF® Image Analysis Module is protected under U.S. Patent number 5,661,816; the LMI Family of Instruments under U. S. Patent Numbers 5,280,336 and 5,416,574; and patents are pending on the SMI Family of Instruments.